Skip to content
Noah Spiegelman
Back to all projects

Project

IonTrace

University of Sydney · Jan 2026 – Jun 2026

IonTrace is a browser-based tool I built as a research intern at the University of Sydney for working with atom probe tomography (APT) data, from raw files to an explorable 3D reconstruction, with AI-assisted parameter suggestions along the way.

Role
Research intern and IonTrace developer
Tools
Next.js, TypeScript, Python, Xe plasma FIB-SEM
  • Software
  • Research
IonTrace's Exploration step: ion species toggles, point size and render mode controls on the left, and a 3D point cloud of 3,000 atoms in the viewport
IonTrace's Exploration step, shown with a sample dataset.

Problem

APT datasets arrive in several file formats and can hold hundreds of thousands of ions. Researchers need one tool that can load them, run the reconstruction and let them explore the result without the 3D view slowing down.

Approach

Alongside the software, I worked through the full APT workflow: SEM-based sample preparation on a Xe plasma FIB-SEM, and fabricating specimens from metal powders by 3D printing and hardening.

IonTrace guides the user through five steps: upload, reconstruction, ranging, exploration and analysis. A Next.js/TypeScript front end sits on a Python backend that parses the multiple APT file formats and runs the reconstruction pipeline.

AI assistance is built into several steps. Reconstruction suggests values for its parameters from similar datasets, with an overall confidence score and High or Medium labels on each value. Ranging can generate mass-range intervals automatically with Auto-Range, and the Analysis metrics (cluster count, average spacing, interface width) carry the same confidence labels. An in-app research assistant sits alongside the workflow.

To keep the viewport responsive on very large datasets, I implemented a display-budget system that dynamically down-samples the point cloud. The user chooses how many points to render, and the interface shows the atoms currently visible, a level-of-detail setting and an estimated frame rate.

In the Exploration step you can toggle ion species, adjust point size and switch between points, density, clusters and iso-surface render modes.

Results

A working tool that loads, reconstructs and explores APT datasets, and stays responsive on datasets with hundreds of thousands of ions. The screenshots on this page use a sample dataset.

IonTrace's Upload step with a file drop area listing the supported formats and a points-to-render setting
Upload: drop in APT files (.rhit, .vval, .apt, .pos, .epos, .rng, .rrng) and choose how many points to render.
IonTrace's Reconstruction step with an 89 percent AI confidence gauge, the reconstruction model, and parameters such as k-factor, image compression factor, field factor and detection efficiency with High or Medium confidence labels
Reconstruction: pick a model (Bas-Chen by default) and tune parameters, with AI-suggested values and confidence labels.
IonTrace's Ranging step with a mass spectrum, colored ranges for Al, Fe, Ni and Cu, and a bulk composition table
Ranging: a mass spectrum with colored ion ranges, plus the bulk composition.
IonTrace's Analysis step with a 1D concentration profile, region-of-interest statistics and composition bars
Analysis: a 1D concentration profile, region-of-interest statistics and composition, with export and report options.
Scanning electron image from the Xe plasma FIB-SEM of a small specimen being prepared, at 2,500 times magnification
Specimen preparation on the Xe plasma FIB-SEM (30 kV, 82.9 µm field of view).
Close-up scanning electron image of a specimen with a 5.936 micrometer measurement marked in green, at 5,000 times magnification
Close-up during preparation: 5,000×, 41.4 µm field of view, with a 5.9 µm feature measured.
Scanning electron image of a small specimen on its support at 2,000 times magnification
The specimen on its support at 2,000× (104 µm field of view).
Four-panel FIB-SEM control view showing electron and ion beam images, the chamber camera, and the EasyLift micromanipulator needle near a specimen
The FIB-SEM control view during specimen preparation, with the EasyLift micromanipulator inserted.